Ireland, Trevor; Ávila, J. N; Lugaro, M; Cristallo, S.; Holden, P.; Lanc, P.; Nittler, L.; Alexander, C.M.O'D.; Gyngard, F.; Amari, S.
Individual isotope abundances of Ba, lanthanides of the rare earth element (REE) group, and Hf have been determined in bulk samples of fine-grained silicon carbide (SiC) from the Murchison CM2 chondrite. The analytical protocol involved secondary ion mass spectrometry with combined high mass resolution and energy filtering to exclude REE oxide isobars and Si-C-O clusters from the peaks of interest. Relative sensitivity factors were determined through analysis of NIST SRM reference glasses (610...[Show more]
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.