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Learning from Corrupted Binary Labels via Class-Probability Estimation

Menon, Aditya; Van Rooyen, Brendan; Ong, Cheng Song; Williamson, Robert

Description

Many supervised learning problems involve learning from samples whose labels are corrupted in some way. For example, each sample may have some constant probability of being incorrectly labelled (learning with label noise), or one may have a pool of unlabelled samples in lieu of negative samples (learning from positive and unlabelled data). This paper uses class-probability estimation to study these and other corruption processes belonging to the mutually contaminated distributions framework...[Show more]

dc.contributor.authorMenon, Aditya
dc.contributor.authorVan Rooyen, Brendan
dc.contributor.authorOng, Cheng Song
dc.contributor.authorWilliamson, Robert
dc.coverage.spatialLille, France
dc.date.accessioned2016-06-14T23:21:14Z
dc.date.createdJuly 6-11 2015
dc.identifier.urihttp://hdl.handle.net/1885/103788
dc.description.abstractMany supervised learning problems involve learning from samples whose labels are corrupted in some way. For example, each sample may have some constant probability of being incorrectly labelled (learning with label noise), or one may have a pool of unlabelled samples in lieu of negative samples (learning from positive and unlabelled data). This paper uses class-probability estimation to study these and other corruption processes belonging to the mutually contaminated distributions framework (Scott et al., 2013), with three conclusions. First, one can optimise balanced error and AUC without knowledge of the corruption process parameters. Second, given estimates of the corruption parameters, one can minimise a range of classification risks. Third, one can estimate the corruption parameters using only corrupted data. Experiments confirm the efficacy of class-probability estimation in learning from corrupted labels
dc.publisherJMLR
dc.relation.ispartofseriesInternational Conference on Machine Learning 2015 ICML
dc.titleLearning from Corrupted Binary Labels via Class-Probability Estimation
dc.typeConference paper
local.description.notesImported from ARIES
local.description.refereedYes
dc.date.issued2015
local.identifier.absfor080107 - Natural Language Processing
local.identifier.ariespublicationu4334215xPUB1514
local.type.statusPublished Version
local.contributor.affiliationMenon, Aditya, College of Engineering and Computer Science, ANU
local.contributor.affiliationVan Rooyen, Brendan, College of Engineering and Computer Science, ANU
local.contributor.affiliationOng, Cheng Song, College of Engineering and Computer Science, ANU
local.contributor.affiliationWilliamson, Robert, College of Engineering and Computer Science, ANU
local.description.embargo2037-12-31
local.bibliographicCitation.startpage125
local.bibliographicCitation.lastpage134
local.identifier.absseo970108 - Expanding Knowledge in the Information and Computing Sciences
dc.date.updated2016-06-14T09:03:20Z
CollectionsANU Research Publications

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