Computer Performance Microscopy with Shim
Developers and architects spend a lot of time trying to understand and eliminate performance problems. Unfortunately, the root causes of many problems occur at a fine granularity that existing continuous profiling and direct measurement approaches cannot observe. This paper presents the design and implementation of Shim, a continuous profiler that samples at resolutions as fine as 15 cycles; three to five orders of magnitude finer than current continuous profilers. Shim's fine-grain...[Show more]
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|Source:||Computer Performance Microscopy with SHIM|
|01_Yang_Computer_Performance_2015.pdf||352.62 kB||Adobe PDF||Request a copy|
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