Computer Performance Microscopy with Shim
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Yang, Xi; Blackburn, Stephen; McKinley, Kathryn
Description
Developers and architects spend a lot of time trying to understand and eliminate performance problems. Unfortunately, the root causes of many problems occur at a fine granularity that existing continuous profiling and direct measurement approaches cannot observe. This paper presents the design and implementation of Shim, a continuous profiler that samples at resolutions as fine as 15 cycles; three to five orders of magnitude finer than current continuous profilers. Shim's fine-grain...[Show more]
Collections | ANU Research Publications |
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Date published: | 2015 |
Type: | Conference paper |
URI: | http://hdl.handle.net/1885/103769 |
Source: | Computer Performance Microscopy with SHIM |
DOI: | 10.1145/2749469.2750401 |
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File | Description | Size | Format | Image |
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01_Yang_Computer_Performance_2015.pdf | 352.62 kB | Adobe PDF | Request a copy |
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