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Computer Performance Microscopy with Shim

Yang, Xi; Blackburn, Stephen; McKinley, Kathryn

Description

Developers and architects spend a lot of time trying to understand and eliminate performance problems. Unfortunately, the root causes of many problems occur at a fine granularity that existing continuous profiling and direct measurement approaches cannot observe. This paper presents the design and implementation of Shim, a continuous profiler that samples at resolutions as fine as 15 cycles; three to five orders of magnitude finer than current continuous profilers. Shim's fine-grain...[Show more]

CollectionsANU Research Publications
Date published: 2015
Type: Conference paper
URI: http://hdl.handle.net/1885/103769
Source: Computer Performance Microscopy with SHIM
DOI: 10.1145/2749469.2750401

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