Characterizing amorphous silicon, silicon nitride, and diffused layers in crystalline siliconsolarcellsusingmicro-photoluminescence spectroscopy
We report and explain the photoluminescence (PL) spectra from crystalline silicon (c-Si) wafers passivated by hydrogenated amorphous silicon (a-Si:H) films under various measurement conditions, utilizing the different absorption coefficients and radiative recombination mechanisms in c-Si and a-Si:H. By comparison with the luminescence properties of a-Si:H, we also demonstrate that SiN. x films deposited under certain silicon-rich conditions yield luminescence spectra similar to those of a-Si:H,...[Show more]
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|Source:||Solar Energy Materials and Solar Cells|
|01_Nguyen_Characterizing_amorphous_2015.pdf||1.41 MB||Adobe PDF||Request a copy|
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