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Characterizing amorphous silicon, silicon nitride, and diffused layers in crystalline siliconsolarcellsusingmicro-photoluminescence spectroscopy

Nguyen, Hieu; Rougieux, Fiacre; Yan, Di; Wan, Yimao; Mokkapati, Sudha; Nicolas, Sylvia Martin de; Seif, Johannes Peter; De Wolf, Stefaan; MacDonald, Daniel

Description

We report and explain the photoluminescence (PL) spectra from crystalline silicon (c-Si) wafers passivated by hydrogenated amorphous silicon (a-Si:H) films under various measurement conditions, utilizing the different absorption coefficients and radiative recombination mechanisms in c-Si and a-Si:H. By comparison with the luminescence properties of a-Si:H, we also demonstrate that SiN. x films deposited under certain silicon-rich conditions yield luminescence spectra similar to those of a-Si:H,...[Show more]

CollectionsANU Research Publications
Date published: 2015
Type: Journal article
URI: http://hdl.handle.net/1885/103391
Source: Solar Energy Materials and Solar Cells
DOI: 10.1016/j.solmat.2015.11.006

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