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Impact of Phosphorous Gettering and Hydrogenation on the Surface Recombination Velocity of Grain Boundaries in p-Type Multicrystalline Silicon

Sio, Hang Cheong (Kelvin); Phang, Sieu Pheng; Trupke, Thorsten; MacDonald, Daniel

Description

We compare the recombination properties of a large number of grain boundaries in multicrystalline silicon wafers with different contamination levels and investigate their response to phosphorous gettering and hydrogenation. The recombination activity of a grain boundary is quantified in terms of the effective surface recombination velocity S<inf>GB</inf> based on photoluminescence imaging and 2-D modeling of the emitted photoluminescence signal. Our results show that varying impurity levels...[Show more]

CollectionsANU Research Publications
Date published: 2015
Type: Journal article
URI: http://hdl.handle.net/1885/103221
Source: IEEE Journal of Photovoltaics
DOI: 10.1109/JPHOTOV.2015.2455341

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