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Thermal activation and deactivation of grown-in defects limiting the lifetime of float-zone silicon

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Grant, Nicholas; Markevich, Vladimir P; Mullins, Jack; Rougieux, Fiacre; Peaker, Anthony R; MacDonald, Daniel

CollectionsANU Research Publications
Date published: 2016
Type: Journal article
URI: http://hdl.handle.net/1885/103125
Source: Physica Status Solidi: Rapid Research Letters
DOI: 10.1002/pssr.201600080

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