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Effect of a High Density of Stacking Faults on the Young's Modulus of GaAs Nanowires

Chen, Yujie; Burgess, Timothy; An, Xianghai; Mai, Yiu-Wing; Zou, Jin; Ringer, Simon P.; Jagadish, Chennupati; Liao, Xiao-Zhou; Tan, Hark Hoe


Stacking faults (SFs) are commonly observed crystalline defects in III–V semiconductor nanowires (NWs) that affect a variety of physical properties. Understanding the effect of SFs on NW mechanical properties is critical to NW applications in nanodevices. In this study, the Young’s moduli of GaAs NWs with two distinct structures, defect-free single crystalline wurtzite (WZ) and highly defective wurtzite containing a high density of SFs (WZ-SF), are investigated using combined in situ...[Show more]

CollectionsANU Research Publications
Date published: 2016
Type: Journal article
Source: Nano Letters
DOI: 10.1021/acs.nanolett.5b05095


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