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Visualization of the internal structure of orientation-patterned III-V semiconductors

Karpinski, Pawel; Chen, Xin; Shvedov, Vladlen; Hnatovsky, Kyrylo (Cyril); Grisard, Arnaud; Lallier, Eric; Luther-Davies, Barry; Sheng, Yan; Krolikowski, Wieslaw

Description

We investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.

dc.contributor.authorKarpinski, Pawel
dc.contributor.authorChen, Xin
dc.contributor.authorShvedov, Vladlen
dc.contributor.authorHnatovsky, Kyrylo (Cyril)
dc.contributor.authorGrisard, Arnaud
dc.contributor.authorLallier, Eric
dc.contributor.authorLuther-Davies, Barry
dc.contributor.authorSheng, Yan
dc.contributor.authorKrolikowski, Wieslaw
dc.coverage.spatialSan Jose, CA
dc.date.accessioned2016-06-14T23:18:56Z
dc.date.created10-15 May 2015
dc.identifier.isbn15365627
dc.identifier.urihttp://hdl.handle.net/1885/102677
dc.description.abstractWe investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.
dc.publisherIEEE
dc.relation.ispartofseriesCLEO 2015: Lasers and Electro-Optics
dc.source.urihttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=7183976&openedRefinements%3D*%26filter%3DAND%28NOT%284283010803%29%29%26pageNumber%3D7%26rowsPerPage%3D100%26queryText%3D%28diffraction+light+%29
dc.titleVisualization of the internal structure of orientation-patterned III-V semiconductors
dc.typeConference paper
local.description.notesImported from ARIES
dc.date.issued2015
local.identifier.absfor020400 - CONDENSED MATTER PHYSICS
local.identifier.absfor090600 - ELECTRICAL AND ELECTRONIC ENGINEERING
local.identifier.absfor091200 - MATERIALS ENGINEERING
local.identifier.ariespublicationa383154xPUB2655
local.type.statusPublished Version
local.contributor.affiliationKarpinski, Pawel, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationChen, Xin, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationShvedov, Vladlen, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationHnatovsky, Kyrylo (Cyril), College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationGrisard, Arnaud, Thales Research and Technology
local.contributor.affiliationLallier, Eric, Thales Research and Technology
local.contributor.affiliationLuther-Davies, Barry, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationKrolikowski, Wieslaw, College of Physical and Mathematical Sciences, ANU
local.contributor.affiliationSheng, Yan, College of Physical and Mathematical Sciences, ANU
local.description.embargo2037-12-31
local.bibliographicCitation.startpage2267-
local.identifier.doi10.1364/CLEO_SI.2015.STh1H.6
dc.date.updated2016-06-14T08:30:44Z
local.identifier.scopusID2-s2.0-84935427809
CollectionsANU Research Publications

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