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Visualization of the internal structure of orientation-patterned III-V semiconductors

Karpinski, Pawel; Chen, Xin; Shvedov, Vladlen; Hnatovsky, Kyrylo (Cyril); Grisard, Arnaud; Lallier, Eric; Luther-Davies, Barry; Krolikowski, Wieslaw; Sheng, Yan

Description

We investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.

CollectionsANU Research Publications
Date published: 2015
Type: Conference paper
URI: http://hdl.handle.net/1885/102677
DOI: 10.1364/CLEO_SI.2015.STh1H.6

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