Visualization of the internal structure of orientation-patterned III-V semiconductors
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Karpinski, Pawel; Chen, Xin; Shvedov, Vladlen; Hnatovsky, Kyrylo (Cyril); Grisard, Arnaud; Lallier, Eric; Luther-Davies, Barry; Sheng, Yan; Krolikowski, Wieslaw
Description
We investigate nonlinear diffraction in orientation-patterned semiconductors and identify Čerenkov second harmonic generation in a transverse geometry of interaction. Čerenkov second harmonic allows nondestructive 3D visualization of the internal structure of orientationpatterned semiconductor.
| Collections | ANU Research Publications |
|---|---|
| Date published: | 2015 |
| Type: | Conference paper |
| URI: | http://hdl.handle.net/1885/102677 |
| DOI: | 10.1364/CLEO_SI.2015.STh1H.6 |
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| File | Description | Size | Format | Image |
|---|---|---|---|---|
| 01_Karpinski_Visualization_of_the_internal_2015.pdf | 150.2 kB | Adobe PDF | Request a copy |
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