Low-cost scheme for high-precision dual-wavelength laser metrology
A method capable of delivering relative optical path length metrology with nanometer precision is demonstrated. Unlike conventional dual-wavelength metrology, which employs heterodyne detection, the method developed in this work utilizes direct detection of interference fringes of two He-Ne lasers as well as a less precise stepper motor open-loop position control system to perform its measurement. Although the method may be applicable to a variety of circumstances, the specific application in...[Show more]
|Collections||ANU Research Publications|
|Access Rights:||Open Access|
|01_Kok_A_Low_Cost_Scheme_2013.pdf||353.83 kB||Adobe PDF|
Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.