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Structural characterization of B-doped diamond nanoindentation tips

Sprouster, David J.; Ruffell, Simon; Bradby, Jodie E.; Williams, James S.; Lockrey, Mark N.; Phillips, Matthew R.; Major, Ryan C.; Warren, Oden L.


We report on the electrical and structural properties of boron-doped diamond tips commonly used for in-situ electromechanical testing during nanoindentation. The boron dopant environment, as evidenced by cathodoluminescence (CL) microscopy, revealed significantly different boron states within each tip. Characteristic emission bands of both electrically activated and nonelectrically activated boron centers were identified in all boron-doped tips. Surface CL mapping also revealed vastly different...[Show more]

CollectionsANU Research Publications
Date published: 2011
Type: Journal article
Source: Journal of Materials Research
DOI: 10.1557/jmr.2011.377


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