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Macdonald-1P-C3-05.pdf.jpg

Temperature and injection-dependent lifetime spectroscopy of copper-related defects silicon

Author(s)Macdonald, D; Cuevas, Andres; Rein, S; Lichtner, P; Glunz, S.W
TypeConference paper
Date Published2003
Date Created2003
Osaka-Fe-paper-with-header.pdf.jpg

Getting and poisoning of silicon wafers by phosphorus diffused layers

Author(s)Macdonald, D; Cheung, A; Cuevas, Andres
TypeConference paper
Date Published2003
Date Created2003
IEEE-with-header.pdf.jpg

Phosphorus gettering in multicrystalline silicon studied by neutron activation analysis

Author(s)Macdonald, D; Cuevas, Andres; Kinomura, A; Nakano, Yukihiro
TypeConference paper
Date Published2002
Date Created2002
NREL2002.pdf.jpg

Injection-dependent lifetime studies of copper precipitates in silicon

Author(s)Macdonald, D; Brendle, W; Cuevas, Andres; Istratov, A.A
TypeConference paper
Date Published2002
Date Created2002
nrelCu.pdf.jpg

Influence of copper on the carrier lifetime of n-type and p-type silicon

Author(s)Stewart, K; Cuevas, Andres; Macdonald, D; Williams, James S
TypeConference paper
Date Published2001
Date Created2001
sims.pdf.jpg

Metallic impurities in multicrystalline silicon

Author(s)Macdonald, D; Cuevas, Andres
TypeConference paper
Date Published2001
Date Created2001
nrelFeB.pdf.jpg

Lifetime spectroscopy of FeB pairs in silicon

Author(s)Macdonald, D; Cuevas, Andres
TypeConference paper
Date Published2001
Date Created2001
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