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Effect of a High Density of Stacking Faults on the Young's Modulus of GaAs Nanowires

Author(s)Chen, Yujie; Burgess, Timothy; An, Xianghai; Mai, Yiu-Wing; Zou, Jin; Ringer, Simon P.; Jagadish, Chennupati; Liao, Xiao-Zhou; Tan, Hark Hoe
TypeJournal article
Date Published2016
Date Created-
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