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Local structures of Ga atoms in Amorphous Silicon and Hydrogenated Amorphous Silicon Before and After Synchrotron X-ray Irradiation

Author(s)Yu, Kin Man; Walukiewicz, W; Muto, S; Jin, H-C; Abelson, J. R.; Clerc, C; Glover, Christopher; Ridgway, Mark C
TypeJournal article
Date Published1999
Date Created-

Implantation-induced Amorphization of InP Characterised with perturbed Angular Correlation

Author(s)Bezakova, E; Vianden, R; Glover, Christopher; Ridgway, Mark C
TypeJournal article
Date Published1999
Date Created-

Proton irradiation of n-type GaAs

Author(s)Goodman, S; Auret, Francois D; Ridgway, Mark C; Myburg, G
TypeJournal article
Date Published1999
Date Created-

Characterisation of ion-implantation-induced disorder in GaAs by EXAFS

Author(s)Glover, Christopher; Yu, Kin Man; Ridgway, Mark C; Foran, Garry J
TypeJournal article
Date Published1999
Date Created-

Atomic Force Microscopy and High-Resolution RBS Investigation of the Surface Modification of Magnetron Sputter-Etched Si(111) in an Argon Plasma at Different Pressures

Author(s)Deenapanray, Prakash; Hillie, K; Demangel, Caroline; Ridgway, Mark C
TypeJournal article
Date Published1999
Date Created-

Structural Characterization of Amorphized InP: Evidence for Chemical Disorder

Author(s)Glover, Christopher; Ridgway, Mark C; Yu, Kin Man; Foran, Garry J; Lee, T W; Moon, Y; Yoon, Euijoon
TypeJournal article
Date Published1999
Date Created-

Effect of MeV O2+ implantation on the reactive ion etch rate of LiTaO3

Author(s)Leech, P W; Ridgway, Mark C
TypeJournal article
Date Published1999
Date Created-

Reduction of Band-Gap Energy in GaNAs and AlGaNAs Synthesized by N+ Implantation

Author(s)Shan, Wei; Yu, Kin Man; Walukiewicz, W; Ager, J W; Haller, E E; Ridgway, Mark C
TypeJournal article
Date Published1999
Date Created-

S and Si ion implantation in GaSb grown on GaAs

Author(s)Rao, Mulpuri V; Berry, Andrew John; Do, Thang Q; Ridgway, Mark C; Chi, P H
TypeJournal article
Date Published1999
Date Created-

Atomic-level characterisation of the structure of amorphised GaAs utilising EXAFS measurements

Author(s)Ridgway, Mark C; Glover, Christopher; Foran, Garry J; Yu, Kin Man
TypeJournal article
Date Published1999
Date Created-

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