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Refractive index profiles of Ge-doped optical fibers with nanometer spatial resolution using atomic force microscopy

Pace, P; Huntington, Shane T; Lyytikainen, Katia I; Roberts, Ann; Love, John

Description

We show a quantitative connection between Refractive Index Profiles (RIP) and measurements made by an Atomic Force Microscope (AFM). Germanium doped fibers were chemically etched in hydrofluoric acid solution (HF) and the wet etching characteristics of germanium were studied using an AFM. The AFM profiles were compared to both a concentration profile of the preform determined using a Scanning Electron Microscope (SEM) and a RIP of the fiber measured using a commercial profiling...[Show more]

dc.contributor.authorPace, P
dc.contributor.authorHuntington, Shane T
dc.contributor.authorLyytikainen, Katia I
dc.contributor.authorRoberts, Ann
dc.contributor.authorLove, John
dc.date.accessioned2009-06-10T05:19:34Z
dc.date.accessioned2010-12-20T06:04:05Z
dc.date.available2009-06-10T05:19:34Z
dc.date.available2010-12-20T06:04:05Z
dc.identifier.citationOptics Express 12.7 (2004): 1452-1457
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/10440/451
dc.identifier.urihttp://digitalcollections.anu.edu.au/handle/10440/451
dc.description.abstractWe show a quantitative connection between Refractive Index Profiles (RIP) and measurements made by an Atomic Force Microscope (AFM). Germanium doped fibers were chemically etched in hydrofluoric acid solution (HF) and the wet etching characteristics of germanium were studied using an AFM. The AFM profiles were compared to both a concentration profile of the preform determined using a Scanning Electron Microscope (SEM) and a RIP of the fiber measured using a commercial profiling instrument, and were found to be in excellent agreement. It is now possible to calculate the RIP of a germanium doped fiber directly from an AFM profile.
dc.format6 pages
dc.publisherOptical Society of America
dc.rights"OSA will grant the authors permission to deposit the publisher’s pdf from their Optics Express articles into the repository with the proper citation (reference number or journal /volume/page/year citation)." - from email received from Authorized Agent, The Optical Society, 27/05/10
dc.sourceOptics Express
dc.source.urihttp://www.opticsinfobase.org/DirectPDFAccess/C889B4FB-BDB9-137E-C59644516563D5E9_79470.pdf?da=1&id=79470&seq=0&CFID=39997365&CFTOKEN=32868506
dc.subjectfiber characterization
dc.subjectindex measurements
dc.subjectatomic force microscopy
dc.titleRefractive index profiles of Ge-doped optical fibers with nanometer spatial resolution using atomic force microscopy
dc.typeJournal article
local.description.refereedYes
local.identifier.citationvolume12
dcterms.dateAccepted2004-03-30
dc.date.issued2004-04-04
local.identifier.absfor020501
local.identifier.ariespublicationMigratedxPub7309
local.type.statusPublished Version
local.contributor.affiliationPace, P, University of Melbourne
local.contributor.affiliationHuntington, Shane T, University of Melbourne
local.contributor.affiliationLyytikainen, Katia I, University of Sydney
local.contributor.affiliationRoberts, Ann, University of Melbourne
local.contributor.affiliationLove, John, Research School of Physical Sciences and Engineering, Department of Theoretical Physics
local.bibliographicCitation.issue7
local.bibliographicCitation.startpage1452
local.bibliographicCitation.lastpage1457
local.identifier.doi10.1364/OPEX.12.001452
dc.date.updated2015-12-11T10:04:16Z
local.identifier.scopusID2-s2.0-2942729902
CollectionsANU Research Publications

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