Skip navigation
Skip navigation
Open Research will be down for maintenance between 8:00 and 8:15 am on Tuesday, December 1 2020.

Refractive index profiles of Ge-doped optical fibers with nanometer spatial resolution using atomic force microscopy

Pace, P; Huntington, Shane T; Lyytikainen, Katia I; Roberts, Ann; Love, John


We show a quantitative connection between Refractive Index Profiles (RIP) and measurements made by an Atomic Force Microscope (AFM). Germanium doped fibers were chemically etched in hydrofluoric acid solution (HF) and the wet etching characteristics of germanium were studied using an AFM. The AFM profiles were compared to both a concentration profile of the preform determined using a Scanning Electron Microscope (SEM) and a RIP of the fiber measured using a commercial profiling...[Show more]

CollectionsANU Research Publications
Date published: 2004-04-04
Type: Journal article
Source: Optics Express
DOI: 10.1364/OPEX.12.001452


File Description SizeFormat Image
Pace_Refractive2004.pdf228.87 kBAdobe PDFThumbnail

Items in Open Research are protected by copyright, with all rights reserved, unless otherwise indicated.

Updated:  19 May 2020/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator