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Exposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique

Gibson, Bradley K; Huntington, Shane T; Rubanov, S; Olivero, P; Digweed-Lyytikainen, K; Canning, J; Love, John

Description

This paper presents a technique to expose and characterize nano-structured hole arrays in tapered photonic crystal fibers. Hole array structures are examined with taper outer diameters ranging from 12.9 μm to 1.6 μm. A combined focused ion beam milling and scanning electron microscope system was used to expose and characterize the arrayed air-silica structures. Results from this combined technique are presented which resolve hole-to-hole pitch sizes and hole diameters in the order of 120...[Show more]

dc.contributor.authorGibson, Bradley K
dc.contributor.authorHuntington, Shane T
dc.contributor.authorRubanov, S
dc.contributor.authorOlivero, P
dc.contributor.authorDigweed-Lyytikainen, K
dc.contributor.authorCanning, J
dc.contributor.authorLove, John
dc.date.accessioned2009-06-01T02:48:26Z
dc.date.accessioned2010-12-20T06:05:32Z
dc.date.available2009-06-01T02:48:26Z
dc.date.available2010-12-20T06:05:32Z
dc.identifier.citationOptics Express 13.22 (2005): 9023-9028
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/10440/355
dc.identifier.urihttp://digitalcollections.anu.edu.au/handle/10440/355
dc.description.abstractThis paper presents a technique to expose and characterize nano-structured hole arrays in tapered photonic crystal fibers. Hole array structures are examined with taper outer diameters ranging from 12.9 μm to 1.6 μm. A combined focused ion beam milling and scanning electron microscope system was used to expose and characterize the arrayed air-silica structures. Results from this combined technique are presented which resolve hole-to-hole pitch sizes and hole diameters in the order of 120 nm and 60 nm, respectively.
dc.format6 pages
dc.publisherOptical Society of America
dc.rights"OSA will grant the authors permission to deposit the publisher’s pdf from their Optics Express articles into the repository with the proper citation (reference number or journal /volume/page/year citation)." - from email received from Authorized Agent, The Optical Society, 27/05/10
dc.sourceOptics Express
dc.source.urihttp://www.opticsinfobase.org/DirectPDFAccess/99A68CFA-BDB9-137E-C3D2F52CBE563A8E_86070.pdf?da=1&id=86070&seq=0&CFID=39997365&CFTOKEN=32868506
dc.subjectfiber optics
dc.subjectlasers, carbon dioxide
dc.subjectfiber characterization
dc.subjectfiber optics imaging
dc.subjectscanning microscopy
dc.titleExposure and characterization of nano-structured hole arrays in tapered photonic crystal fibers using a combined FIB/SEM technique
dc.typeJournal article
local.description.notesArticle written under name Gibson, Bradley C.
local.description.refereedYes
local.identifier.citationvolume13
dcterms.dateAccepted2005-10-22
dc.date.issued2005-10-31
local.identifier.absfor020501
local.identifier.ariespublicationMigratedxPub11454
local.type.statusPublished Version
local.contributor.affiliationGibson, Bradley K, University of Central Lancashire
local.contributor.affiliationHuntington, Shane T, University of Melbourne
local.contributor.affiliationRubanov, S, University of Melbourne
local.contributor.affiliationOlivero, P, University of Melbourne
local.contributor.affiliationDigweed-Lyytikainen, K, University of Sydney
local.contributor.affiliationCanning, J, University of Sydney
local.contributor.affiliationLove, John, Research School of Physical Sciences and Engineering, Department of Theoretical Physics
local.bibliographicCitation.issue22
local.bibliographicCitation.startpage9023
local.bibliographicCitation.lastpage9028
local.identifier.doi10.1364/OPEX.13.009023
dc.date.updated2015-12-12T07:20:17Z
local.identifier.scopusID2-s2.0-27544465828
CollectionsANU Research Publications

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