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Metal-free scanning optical microscopy with a fractal fiber probe

Rollinson, Claire M; Orbons, Shannon; Huntington, Shane T; Gibson, Brant Cameron; Canning, J; Love, John; Roberts, Ann; Jamieson, David Norman


Scanning Near-field Optical Microscopy (SNOM) is the leading instrument used to image optical fields on the nanometer scale. A metalcoating is typically applied to SNOM probes to define a subwavelength aperture and minimize optical leakage, but the presence of such coatings in the near field of the sample can often cause a substantial change in the sample emission properties. For the first time, the authors demonstrate nearfield imaging on a metal substrate with a metal-free probe made...[Show more]

CollectionsANU Research Publications
Date published: 2009-01-29
Type: Journal article
Source: Optics Express
DOI: 10.1364/OE.17.001772


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