Adapting Fine-Grained Cross-View Localization to Areas Without Fine Ground Truth

dc.contributor.authorXia, Ziminen
dc.contributor.authorShi, Yujiaoen
dc.contributor.authorLi, Hongdongen
dc.contributor.authorKooij, Julian F.P.en
dc.date.accessioned2025-05-23T09:26:29Z
dc.date.available2025-05-23T09:26:29Z
dc.date.issued2024en
dc.description.abstractGiven a ground-level query image and a geo-referenced aerial image that covers the query’s local surroundings, fine-grained cross-view localization aims to estimate the location of the ground camera inside the aerial image. Recent works have focused on developing advanced networks trained with accurate ground truth (GT) locations of ground images. However, the trained models always suffer a performance drop when applied to images in a new target area that differs from training. In most deployment scenarios, acquiring fine GT, i.e. accurate GT locations, for target-area images to re-train the network can be expensive and sometimes infeasible. In contrast, collecting images with noisy GT with errors of tens of meters is often easy. Motivated by this, our paper focuses on improving the performance of a trained model in a new target area by leveraging only the target-area images without fine GT. We propose a weakly supervised learning approach based on knowledge self-distillation. This approach uses predictions from a pre-trained model as pseudo GT to supervise a copy of itself. Our approach includes a mode-based pseudo GT generation for reducing uncertainty in pseudo GT and an outlier filtering method to remove unreliable pseudo GT. Our approach is validated using two recent state-of-the-art models on two benchmarks. The results demonstrate that it consistently and considerably boosts the localization accuracy in the target area.en
dc.description.sponsorshipThis work is part of the research programme Efficient Deep Learning (EDL) with project number P16-25, which is (partly) financed by the Dutch Research Council (NWO).en
dc.description.statusPeer-revieweden
dc.format.extent19en
dc.identifier.isbn9783031727504en
dc.identifier.isbn978-3-031-72751-1en
dc.identifier.otherORCID:/0000-0003-4125-1554/work/184100042en
dc.identifier.otherdblp:conf/eccv/XiaSLK24en
dc.identifier.otherWOS:001352791200023en
dc.identifier.scopus85213119529en
dc.identifier.urihttp://www.scopus.com/inward/record.url?scp=85213119529&partnerID=8YFLogxKen
dc.identifier.urihttps://hdl.handle.net/1885/733751981
dc.language.isoenen
dc.publisherSpringer Science+Business Media B.V.en
dc.relation.ispartofComputer Vision - Eccv 2024, Pt Xxxien
dc.relation.ispartofseries18th European Conference on Computer Vision, ECCV 2024en
dc.relation.ispartofseriesLecture Notes In Computer Scienceen
dc.rights© The Author(s).en
dc.titleAdapting Fine-Grained Cross-View Localization to Areas Without Fine Ground Truthen
dc.typeConference paperen
dspace.entity.typePublicationen
local.bibliographicCitation.lastpage415en
local.bibliographicCitation.startpage397en
local.contributor.affiliationXia, Zimin; Swiss Federal Institute of Technology Lausanneen
local.contributor.affiliationShi, Yujiao; ShanghaiTech Universityen
local.contributor.affiliationLi, Hongdong; School of Computing, ANU College of Systems and Society, The Australian National Universityen
local.contributor.affiliationKooij, Julian F.P.; Delft University of Technologyen
local.identifier.citationvolume15089en
local.identifier.doi10.1007/978-3-031-72751-1_23en
local.identifier.pure8ea1e954-5044-4cf0-8301-78bfcf35fabaen
local.identifier.urlhttps://www.scopus.com/pages/publications/85213119529en
local.type.statusPublisheden

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