Quantum metrology with mixed states: When recovering lost information is better than never losing it

dc.contributor.authorHaine, Simon A.en
dc.contributor.authorSzigeti, Stuart S.en
dc.date.accessioned2025-06-11T16:36:15Z
dc.date.available2025-06-11T16:36:15Z
dc.date.issued2015-09-17en
dc.description.abstractQuantum-enhanced metrology can be achieved by entangling a probe with an auxiliary system, passing the probe through an interferometer, and subsequently making measurements on both the probe and auxiliary system. Conceptually, this corresponds to performing metrology with the purification of a (mixed) probe state. We demonstrate via the quantum Fisher information how to design mixed states whose purifications are an excellent metrological resource. In particular, we give examples of mixed states with purifications that allow (near) Heisenberg-limited metrology and provide examples of entangling Hamiltonians that can generate these states. Finally, we present the optimal measurement and parameter-estimation procedure required to realize these sensitivities (i.e., that saturate the quantum Cramér-Rao bound). Since pure states of comparable metrological usefulness are typically challenging to generate, it may prove easier to use this approach of entanglement and measurement of an auxiliary system. An example where this may be the case is atom interferometry, where entanglement with optical systems is potentially easier to engineer than the atomic interactions required to produce nonclassical atomic states.en
dc.description.statusPeer-revieweden
dc.identifier.issn1050-2947en
dc.identifier.otherORCID:/0000-0002-3015-6511/work/163626730en
dc.identifier.scopus84942154719en
dc.identifier.urihttp://www.scopus.com/inward/record.url?scp=84942154719&partnerID=8YFLogxKen
dc.identifier.urihttps://hdl.handle.net/1885/733758816
dc.language.isoenen
dc.rightsPublisher Copyright: © 2015 American Physical Society. ©2015 American Physical Society.en
dc.sourcePhysical Review A - Atomic, Molecular, and Optical Physicsen
dc.titleQuantum metrology with mixed states: When recovering lost information is better than never losing iten
dc.typeJournal articleen
dspace.entity.typePublicationen
local.contributor.affiliationHaine, Simon A.; School of Mathematics and Physicsen
local.contributor.affiliationSzigeti, Stuart S.; School of Mathematics and Physicsen
local.identifier.citationvolume92en
local.identifier.doi10.1103/PhysRevA.92.032317en
local.identifier.pure54a56b59-0a32-4811-b49d-00f5c9c21abeen
local.identifier.urlhttps://www.scopus.com/pages/publications/84942154719en
local.type.statusPublisheden

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