Diffusion and precipitation in amorphous Si
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Elliman, R. G.
Gibson, J. M.
Jacobson, D. C.
Poate, J. M.
Williams, J. S.
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Abstract
The diffusion and precipitation of several ion implanted impurities in amorphous Si have been observed at temperatures of 300-600°C. Typical slow diffusers in crystalline Si, such as As, In, Sb, and Bi, show little or no diffusion at low concentrations. At high concentrations (>1 at. %), they diffuse rapidly with D≳10-15 cm 2/s in the temperature range 500-600°C. Typical fast diffusers in crystalline Si, such as Cu and Au, diffuse in amorphous Si with D>10 -12 cm2/s at 400-600°C. Precipitation has been observed for both the fast and slow diffusers in amorphous Si.
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Applied Physics Letters
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