Precipitation of interstitial iron in multicrystalline silicon

Date

Authors

Liu, An Yao
Macdonald, Daniel

Journal Title

Journal ISSN

Volume Title

Publisher

Trans Tech Publications Ltd.

Access Statement

Research Projects

Organizational Units

Journal Issue

Abstract

The internal gettering of iron in silicon via iron precipitation at low processing temperatures is known to improve solar cell efficiencies. Studies have found that the optimal temperature lies in the range of 500°C-600°C. In this paper, we present experimental results on quantitatively analysing the precipitation of interstitial Fe in multicrystalline silicon wafers during the 500°C-600°C thermal annealing processes. The concentration and the spatial distribution of interstitial Fe in mc-Si were measured by the photoluminescence imaging technique. It was found that, apart from the processing temperature, the Fe precipitation time constant is highly dependent on the supersaturation ratio and the density and types of the precipitation sites.

Description

Citation

Source

Book Title

Gettering and Defect Engineering in Semiconductor Technology XV

Entity type

Publication

Access Statement

License Rights

Restricted until