Introduction to X-ray absorption spectroscopy

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dc.contributor.authorSchnohr, Claudia S.en
dc.contributor.authorRidgway, Mark C.en
dc.date.accessioned2025-12-17T15:40:51Z
dc.date.available2025-12-17T15:40:51Z
dc.date.issued2015en
dc.description.abstractX-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolving technique. The chapter thus is a starting point upon which subsequent chapters build as they demonstrate the broad-ranging applications of XAS to semiconductors materials.en
dc.description.statusPeer-revieweden
dc.identifier.issn0342-4111en
dc.identifier.scopus84921468520en
dc.identifier.urihttps://hdl.handle.net/1885/733796102
dc.language.isoenen
dc.rightsPublisher Copyright: © Springer-Verlag Berlin Heidelberg 2015.en
dc.sourceSpringer Series in Optical Sciencesen
dc.titleIntroduction to X-ray absorption spectroscopyen
dc.typeJournal articleen
dspace.entity.typePublicationen
local.contributor.affiliationSchnohr, Claudia S.; Friedrich Schiller University Jenaen
local.contributor.affiliationRidgway, Mark C.; Department of Electronic Materials Engineering, Research School of Physics, ANU College of Science and Medicine, The Australian National Universityen
local.identifier.ariespublicationU3594520xPUB655en
local.identifier.citationvolume190en
local.identifier.doi10.1007/978-3-662-44362-0_1en
local.identifier.pure8a279e7b-6574-4883-af39-5fa9374ff766en
local.identifier.urlhttps://www.scopus.com/pages/publications/84921468520en
local.type.statusPublisheden

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