Skip navigation
Skip navigation

Browsing by Subject 10 keV O ions

Or enter first few letters:  
Showing results 1 to 1 of 1
01_Vos_A_high-energy_electron_2013.pdf.jpg

A high-energy electron scattering study of the electronic structure and elemental composition of O-implanted Ta films used for the fabrication of memristor devices

Author(s)Vos, Maarten; Grande, Pedro L.; Nandi, Sanjoy K., et al
TypeJournal article
Date Published2013
Date Created-
  • previous
  • 1
  • next

Updated:  12 April 2016/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator