Browsing by Author Zhang, Chun
Showing results 1 to 14 of 14
Effect of atomic H exposure on thermally oxidized Si/Si02 interfaces
Author(s) | Zhang, Chun; Weber, Klaus; Jin, Hao |
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Type | Conference paper |
Date Published | 2009 |
Date Created | September 21-24 2009 |
Effect of diffusions on Si surface passivation
Author(s) | Jin, Hao; Jellett, Wendy; Zhang, Chun, et al |
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Type | Conference paper |
Date Published | 2008 |
Date Created | September 1-4 2008 |
Effect of Phosphorus Diffusion to the Recombination at the Si-SiO2 Interface
Author(s) | Jin, Hao; Weber, Klaus; Zhang, Chun |
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Type | Journal article |
Date Published | 2009 |
Date Created | - |
Hydrogen introduction by acid solution to Si/Si02 interface
Author(s) | Zhang, Chun; Jin, Hao; Jellett, Wendy, et al |
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Type | Conference paper |
Date Published | 2008 |
Date Created | September 1-4 2008 |
The Impact of Atomic Hydrogen on the Properties of the Silicon/Silicon Dioxide Interface
Author(s) | Zhang, Chun |
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Type | Thesis (PhD) |
Date Published | 2010 |
Date Created | - |
Introduction of Negative Charges in Nitride for PV Applications
Author(s) | Jin, Hao; Weber, Klaus; Paudyal, Bijaya, et al |
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Type | Conference paper |
Date Published | 2009 |
Date Created | June 7-12 2009 |
Investigation of Lifetime Degradation of RIE-Processed Silicon Samples for Solar Cells
Author(s) | Zin, Ngwe Soe; Weber, Klaus; Zhang, Chun, et al |
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Type | Conference paper |
Date Published | 2009 |
Date Created | June 7-12 2009 |
Low SI surface recombination through negatively charged Si3N4 films
Author(s) | Jin, Hao; Weber, Klaus; Zhang, Chun, et al |
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Type | Conference paper |
Date Published | 2009 |
Date Created | September 21-24 2009 |
Passivation and depassivation of Si-SiO 2 interfaces with atomic hydrogen
Author(s) | Zhang, Chun; Weber, Klaus; Jin, Hao |
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Type | Journal article |
Date Published | 2009 |
Date Created | - |
Surface passivation using dielectric films: How much charge is enough?
Author(s) | Weber, Klaus; Jin, Hao; Zhang, Chun, et al |
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Type | Conference paper |
Date Published | 2009 |
Date Created | September 21-24 2009 |
The effect of exposure of Si-Si02 structure to atomic H by PECVD reactor
Author(s) | Zhang, Chun; Weber, Klaus; Jin, Hao, et al |
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Type | Conference paper |
Date Published | 2009 |
Date Created | June 7-12 2009 |
The influence of corona charging on the Si/Si02 interface
Author(s) | Zhang, Chun; Jin, Hao; Jellett, Wendy, et al |
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Type | Conference paper |
Date Published | 2008 |
Date Created | September 1-4 2008 |
The Thermal Stability of Atomic H Plasma Produced Interface Defects on Si-Si02 Stack
Author(s) | Zhang, Chun; Weber, Klaus |
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Type | Conference paper |
Date Published | 2010 |
Date Created | June 20-25 2010 |
Towards industrial advanced front-junction n-type silicon solar cells
Author(s) | Wan, Yimao; Samundsett, Christian; Kho, Teng, et al |
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Type | Conference paper |
Date Published | 2014 |
Date Created | June 8-13 2014 |
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