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01_Choul Kim_Nonvolatile_memories_using_2011.pdf.jpg

Nonvolatile memories using deep traps formed in HfO₂ by Nb ion implantation

Author(s)Choul Kim, Min; Oh Kim, Chang; Taek Oh, Houng, et al
TypeJournal article
Date Published8-Mar-2011
Date Created-
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