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vien98.pdf.jpg

Applications of the quasi-steady-state photoconductance technique

Author(s)Cuevas, Andres; Stocks, Matthew; Macdonald, D, et al
TypeConference paper
Date Published1998
Date Created1998
boronapl.pdf.jpg

Boron-related minority-carrier trapping centers in p-type silicon

Author(s)Macdonald, D; Kerr, Mark John; Cuevas, Andres
TypeJournal article
Date Published1999
Date Created1999
Macdonald_Capture2001.pdf.jpg

Capture cross sections of the acceptor level of iron-boron pairs in p-type silicon by injection-level dependent lifetime measurements

Author(s)Macdonald, D; Cuevas, Andres; Wong-Leung, Yin-Yin
TypeJournal article
Date Published15-Jun-2001
Date Created-
Osaka-Fe-paper-with-header.pdf.jpg

Getting and poisoning of silicon wafers by phosphorus diffused layers

Author(s)Macdonald, D; Cheung, A; Cuevas, Andres
TypeConference paper
Date Published2003
Date Created2003
nrelCu.pdf.jpg

Influence of copper on the carrier lifetime of n-type and p-type silicon

Author(s)Stewart, K; Cuevas, Andres; Macdonald, D, et al
TypeConference paper
Date Published2001
Date Created2001
2AO_2_3.PDF.jpg

Influence of reactive ion etching on the minority carrier lifetime in P-type Si

Author(s)Deenapanray, P. N. K; Athukorala, C. S; Macdonald, D, et al
TypeConference paper
Date Published-
Date Created2005
NREL2002.pdf.jpg

Injection-dependent lifetime studies of copper precipitates in silicon

Author(s)Macdonald, D; Brendle, W; Cuevas, Andres, et al
TypeConference paper
Date Published2002
Date Created2002
nrelFeB.pdf.jpg

Lifetime spectroscopy of FeB pairs in silicon

Author(s)Macdonald, D; Cuevas, Andres
TypeConference paper
Date Published2001
Date Created2001
Si-impl-two-col-post-rev.pdf.jpg

Lifetime studies of deeply penetrating defects in self-ion implanted silicon

Author(s)Macdonald, D; Maeckel, H; Doshi, S, et al
TypeJournal article
Date Published2003
Date Created2003
sims.pdf.jpg

Metallic impurities in multicrystalline silicon

Author(s)Macdonald, D; Cuevas, Andres
TypeConference paper
Date Published2001
Date Created2001
biasJAP.pdf.jpg

On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon

Author(s)Macdonald, D; Sinton, R.A; Cuevas, Andres
TypeJournal article
Date Published2001
Date Created2001
nrel99.pdf.jpg

Origins of carrier traps in p-type multicrystalline silicon

Author(s)Cuevas, Andres; Macdonald, D
TypeConference paper
Date Published1999
Date Created1999
IEEE-with-header.pdf.jpg

Phosphorus gettering in multicrystalline silicon studied by neutron activation analysis

Author(s)Macdonald, D; Cuevas, Andres; Kinomura, A, et al
TypeConference paper
Date Published2002
Date Created2002
trans99.pdf.jpg

Recombination and trapping in multicrystalline silicon

Author(s)Cuevas, Andres; Stocks, Matthew; Macdonald, D, et al
TypeJournal article
Date Published1999
Date Created1999
02whole.pdf.jpg

Recombination and Trapping in Multicrystalline Silicon Solar Cells

Author(s)Macdonald, D
TypeThesis (PhD)
Date Published2001
Date Created-
Macdonald-1P-C3-05.pdf.jpg

Temperature and injection-dependent lifetime spectroscopy of copper-related defects silicon

Author(s)Macdonald, D; Cuevas, Andres; Rein, S, et al
TypeConference paper
Date Published2003
Date Created2003
trapapl.pdf.jpg

Trapping of minority carriers in multicrystalline silicon

Author(s)Macdonald, D; Cuevas, Andres
TypeJournal article
Date Published1999
Date Created1999
SRH-PRB-two-col.pdf.jpg

Validity of Shockley-Read-Hall statistics for modeling carrier lifetimes in silicon

Author(s)Macdonald, D; Cuevas, Andres
TypeJournal article
Date Published2003
Date Created2003
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