Browsing by Author Lennard, W N
Showing results 1 to 2 of 2
Characterization of Silicon Oxynitride Films using Ion Beam Analysis Techniques
Author(s) | Walker, S R; Davies, J; Mascher, P, et al |
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Type | Journal article |
Date Published | 2000 |
Date Created | - |
Round Robin: Measurement of H Implantation Distributions in Si by Elastic Recoil Detection
Author(s) | Boudreault, G; Elliman, Robert; Grotzschel, R, et al |
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Type | Journal article |
Date Published | 2004 |
Date Created | - |
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