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Browsing by Author Glover, Christopher

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Showing results 1 to 20 of 33

Atomic-level characterisation of ion-induced amorphisation in compound semiconductors

Author(s)Ridgway, Mark C; Glover, Christopher; Bezakova, E, et al
TypeJournal article
Date Published1999
Date Created-

Atomic-level characterisation of the structure of amorphised GaAs utilising EXAFS measurements

Author(s)Ridgway, Mark C; Glover, Christopher; Foran, Garry J, et al
TypeJournal article
Date Published1999
Date Created-

Atomic-scale Structure of Irradiated GaN compared to Amorphised GaP and GaAs

Author(s)Ridgway, Mark C; Everett, Sarah; Glover, Christopher, et al
TypeJournal article
Date Published2006
Date Created-

Characterisation of ion-implantation-induced disorder in GaAs by EXAFS

Author(s)Glover, Christopher; Yu, Kin Man; Ridgway, Mark C, et al
TypeJournal article
Date Published1999
Date Created-

Comparative Studies using EXAFS and PAC of Lattice Damage in Semiconductors

Author(s)Byrne, Aidan; Ridgway, Mark C; Glover, Christopher, et al
TypeJournal article
Date Published2004
Date Created-

Composition-dependent bondlengths in crystalline and amorphous GexSi1-x alloys

Author(s)Ridgway, Mark C; Glover, Christopher; Yu, Kin Man, et al
TypeJournal article
Date Published1999
Date Created-

Diffusion Limited Cu and Au Nanocrystal Formation in Thin Film SiO 2

Author(s)Johannessen, Bernt; Kluth, Patrick; Glover, Christopher, et al
TypeJournal article
Date Published2006
Date Created-

Disorder in Au and Cu Nanocrystals formed by Ion Implantation into Thin SiO 2

Author(s)Kluth, Patrick; Johannessen, Bernt; Glover, Christopher, et al
TypeJournal article
Date Published2005
Date Created-

EXAFS Characterisation of Ge Nanocrystals in Silica

Author(s)Ridgway, Mark C; Azevedo, G de M; Glover, Christopher, et al
TypeJournal article
Date Published2004
Date Created-

EXAFS Comparison of Crystalline/Continuous and Amorphous/Porous GaSb

Author(s)Kluth, Susan; Johannessen, Bernt; Kluth, Patrick, et al
TypeJournal article
Date Published2005
Date Created-

Formation and Electronic Structure of Germanium Nanocrystals formed by Ion Beam Synthesis

Author(s)Glover, Christopher; Ridgway, Mark C; Llewellyn, David, et al
TypeJournal article
Date Published2005
Date Created-

GISAXS Studies of Structural Modifications in Ion-beam Amorphized Ge

Author(s)Desnica-Frankovic, I D; Dubcek, P; Desnica, U V, et al
TypeJournal article
Date Published2006
Date Created-

Implantation-induced Amorphization of InP Characterised with perturbed Angular Correlation

Author(s)Bezakova, E; Vianden, R; Glover, Christopher, et al
TypeJournal article
Date Published1999
Date Created-

Implantation-induced Disorder in Amorphous Ge: Production and Relaxation

Author(s)Ridgway, Mark C; Glover, Christopher; Desnica-Frankovic, I D, et al
TypeJournal article
Date Published2001
Date Created-

Ion-Dose-Dependent Microstructure in Amorphous Ge

Author(s)Ridgway, Mark C; Glover, Christopher; Foran, Garry J, et al
TypeJournal article
Date Published2000
Date Created-

Ion-Irradiation-Induced Preferential Amorphization of Ge Nanocrystals in Silica

Author(s)Ridgway, Mark C; Azevedo, G de M; Elliman, Robert, et al
TypeJournal article
Date Published2005
Date Created-

Irradiation Induced Defects in Nanocrystalline Cu

Author(s)Johannessen, Bernt; Kluth, Patrick; Glover, Christopher, et al
TypeJournal article
Date Published2005
Date Created-

Irradiation-induced defect configurations in Ge substrates characterised with perturbed angular correlation

Author(s)Glover, Christopher; Byrne, Aidan; Ridgway, Mark C
TypeJournal article
Date Published2001
Date Created-

Local structures of Ga atoms in Amorphous Silicon and Hydrogenated Amorphous Silicon Before and After Synchrotron X-ray Irradiation

Author(s)Yu, Kin Man; Walukiewicz, W; Muto, S, et al
TypeJournal article
Date Published1999
Date Created-

Novel Preparation Methods for the Fabrication of Thin-Film EXAFS Samples

Author(s)Ridgway, Mark C; Glover, Christopher; Kluth, Patrick, et al
TypeBook chapter
Date Published2007
Date Created-

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