Browsing by Author Doshi, Sachin
Showing results 1 to 2 of 2
Carrier lifetime studies of deeply penetrating defects in self-ion implanted silicon
Author(s) | MacDonald, Daniel; Mackel, Helmut; Doshi, Sachin, et al |
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Type | Journal article |
Date Published | 2003 |
Date Created | - |
Towards a better understanding of the operative mechanisms underlying impurity-free disordering of GaAs: Effect of stress
Author(s) | Doshi, Sachin; Deenapanray, Prakash N. K.; Jagadish, C., et al |
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Type | Journal article |
Date Published | 17-Jan-2003 |
Date Created | - |
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