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Browsing by Author Doshi, Sachin

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Carrier lifetime studies of deeply penetrating defects in self-ion implanted silicon

Author(s)MacDonald, Daniel; Mackel, Helmut; Doshi, Sachin, et al
TypeJournal article
Date Published2003
Date Created-
01_Doshi_Towards_a_better_understanding_2003.pdf.jpg

Towards a better understanding of the operative mechanisms underlying impurity-free disordering of GaAs: Effect of stress

Author(s)Doshi, Sachin; Deenapanray, Prakash N. K.; Jagadish, C., et al
TypeJournal article
Date Published17-Jan-2003
Date Created-
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