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Browsing by Author Crotti, C.

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Characterisation of molecular nitrogen in ion-bombarded compound semiconductors by synchrotron-based absorption and emission spectroscopies

Author(s)Bozanic, A; Majlinger, Z; Petravic, Mladen, et al
TypeJournal article
Date Published2009
Date Created-

Characterisation of nitrogen-related defects in compound semiconductors by near-edge x-ray absorption fine structure

Author(s)Petravic, M; Majlinger, Z; Bozanic, A, et al
TypeConference paper
Date Published2008
Date Created28 July 2008 through 1 August 2008
01_Bozanic_Characterization_of_molecular_2008.pdf.jpg

Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies

Author(s)Bozanic, A.; Majlinger, Z.; Petravic, M., et al
TypeJournal article
Date Published9-Jun-2008
Date Created-
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