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Browsing by Author Williams, James S

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Showing results 6 to 8 of 8
nrelCu.pdf.jpg

Influence of copper on the carrier lifetime of n-type and p-type silicon

Author(s)Stewart, K; Cuevas, Andres; Macdonald, D, et al
TypeConference paper
Date Published2001
Date Created2001
Si-impl-two-col-post-rev.pdf.jpg

Lifetime studies of deeply penetrating defects in self-ion implanted silicon

Author(s)Macdonald, D; Maeckel, H; Doshi, S, et al
TypeJournal article
Date Published2003
Date Created2003
Bao_Point2007.pdf.jpg

Point defect engineered Si sub-bandgap light-emitting diode

Author(s)Bao, Jiming; Tabbal, Malek; Kim, Taegon, et al
TypeJournal article
Date Published16-May-2007
Date Created-

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