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Browsing by Author Williams, James

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Showing results 43 to 62 of 138

ICP Dry Etching of ZnO and Effects of Hydrogen

Author(s)Ip, K; Overberg, M E; Baik, K W, et al
TypeJournal article
Date Published2003
Date Created-

Imaging Charge Trap Distributions in GaN Using Environmental Scanning Electron Micrsocopy

Author(s)Toth, M; Kucheyev, Sergei; Williams, James, et al
TypeJournal article
Date Published2000
Date Created-

Implantation-Produced Structural Damage in In x Ga 1-x N

Author(s)Kucheyev, Sergei; Williams, James; Zou, Jin, et al
TypeJournal article
Date Published2001
Date Created-

Implantion-Induced Nanocavities and Au Nanoparticles in Si and Si0 2

Author(s)Williams, James; Conway, Martin; Charnvanichborikarn, Supakit
TypeConference paper
Date Published2006
Date CreatedJuly 3-7 2006

In Situ Electrical Characterization of Phase Transformations in Si during Indentation

Author(s)Bradby, Jodie; Williams, James; Swain, Michael Vincent
TypeJournal article
Date Published2003
Date Created-

In Situ Measurements of the Channeling Dependence of Ion-beam-induced Recrystallization in Silicon

Author(s)de Azevedo, Gustavo; Williams, James; Young, I M, et al
TypeJournal article
Date Published2002
Date Created-

In-situ Microscopy Study of Nanocavity Shrinkage in Si under Ion Beam Irradiation

Author(s)Ruault, M-O; Ridgway, Mark C; Fortuna, Frank Nicholas, et al
TypeJournal article
Date Published2003
Date Created-

Increased Dissolution of Ilmenite Induced by High-Energy Ball Milling

Author(s)Chen, Ying; Williams, James; Wang, G, et al
TypeJournal article
Date Published1999
Date Created-

Indentation-Induced Damage Mechanisms in Germanium

Author(s)Oliver, David; Bradby, Jodie; Williams, James, et al
TypeConference paper
Date Published2007
Date CreatedNovember 27-December 1 2006

Instability of Nanocavities in Amorphous Silicon

Author(s)Zhu, Xiaohua; Williams, James; Llewellyn, David, et al
TypeJournal article
Date Published1999
Date Created-

Interaction of Defects and Metals with Nanocavities in Silicon

Author(s)Williams, James; Ridgway, Mark C; Conway, Martin, et al
TypeJournal article
Date Published2001
Date Created-

Interactions of Point Defects and Impurities With Open Volume Defects in Silicon

Author(s)Williams, James; Ridgway, Mark C; Conway, Martin, et al
TypeConference paper
Date Published2001
Date CreatedNovember 27 2000

Investigation of Combustion Reactions under Different Milling Conditions

Author(s)Jar, P Y (Ben); Williams, James
TypeJournal article
Date Published1999
Date Created-

Ion beam induced dissociation and bubble formation in GaN

Author(s)Kucheyev, Sergei; Williams, James; Zou, Jin, et al
TypeJournal article
Date Published2000
Date Created-

Ion Beam Induced Epitaxy Experiments in Silicon under Channeling and Random Alignments

Author(s)Williams, James; Young, I M; Conway, Martin
TypeJournal article
Date Published2000
Date Created-

Ion Beam Modification of Thermal Stress Resistance of MgO Single Crystals with Different Crystallographic Faces

Author(s)Gurarie, V N; Otsuka, P H; Williams, James, et al
TypeJournal article
Date Published2001
Date Created-

Ion Implantation into GaN

Author(s)Kucheyev, Sergei; Williams, James; Pearton, S J
TypeJournal article
Date Published2001
Date Created-

Ion Irradiation-induced Disordering of Semiconductors: Defect Structures and Applications

Author(s)Williams, James; Kucheyev, Sergei; Wong-Leung, Yin-Yin (Jennifer), et al
TypeJournal article
Date Published2005
Date Created-

Ion-Beam-Defect Processes in Group-III Nitrides and ZnO

Author(s)Kucheyev, Sergei O; Williams, James; Jagadish, Chennupati
TypeJournal article
Date Published2004
Date Created-

Ion-Beam-Induced Amorphization and Epitaxial Crystallization of Silicon

Author(s)Williams, James; de Azevedo, Gustavo; Bernas, Harry, et al
TypeBook chapter
Date Published2010
Date Created-

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