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Browsing by Author Williams, J. S.

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Showing results 38 to 42 of 42

The indentation hardness of silicon measured by instrumented indentation: What does it mean?

Author(s)Haberl, Bianca; Bayu Aji, Leonardus Bimo; Williams, J. S., et al
TypeJournal article
Date Published28-Dec-2012
Date Created-
1.5002705.pdf.jpg

Thermal stability of simple tetragonal and hexagonal diamond germanium

Author(s)Huston, Larissa; Johnson, B. C.; Haber, Bianca, et al
TypeJournal article
Date Published2017
Date Created-
01_Fujisawa_Understanding_pressure-induced_2009.pdf.jpg

Understanding pressure-induced phase-transformation behavior in silicon through in situ electrical probing under cyclic loading conditions

Author(s)Fujisawa, N.; Ruffell, S.; Bradby, J. E., et al
TypeJournal article
Date Published26-May-2009
Date Created-
01_Haberl_Unexpected_short-_and_2011.pdf.jpg

Unexpected short- and medium-range atomic structure of sputtered amorphous silicon upon thermal annealing

Author(s)Haberl, Bianca; Bogle, S. N.; Li, T., et al
TypeJournal article
Date Published7-Nov-2011
Date Created-
01_Kucheyev_X-ray_spectrometry_2002.pdf.jpg

X-ray spectrometry investigation of electrical isolation in GaN

Author(s)Kucheyev, S. O.; Toth, M.; Phillips, M. R., et al
TypeJournal article
Date Published15-Mar-2002
Date Created-

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