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Browsing by Author Ruffell, Simon

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Showing results 23 to 36 of 36

PALS-based characterisation of defect structures in F-implanted Germanium

Author(s)Sprouster, David; Campbell, Colin; Buckman, Stephen, et al
TypeConference paper
Date Published2012
Date CreatedDecember 9-13 2012

Phase stability of silicon during indentation at elevated temperature: evidence for a direct transformation from metallic Si-II to diamond cubic Si-I

Author(s)Bhuyan, Satyam; Bradby, Jodie; Ruffell, Simon, et al
TypeJournal article
Date Published2012
Date Created-

Phase transformation pathways in amorphous germanium under indentation pressure

Author(s)Deshmukh, Sarita; Haberl, Bianca; Ruffell, Simon, et al
TypeJournal article
Date Published2014
Date Created-

Quantitative electromechanical characterization of materials using conductive ceramic tips

Author(s)Sprouster, David; Ruffell, Simon; Bradby, Jodie, et al
TypeJournal article
Date Published2014
Date Created-
01_Venkatachalam_Rapid,_substrate-independent_2011.pdf.jpg

Rapid, substrate-independent thickness determination of large area graphene layers

Author(s)Venkatachalam, Dinesh K.; Parkinson, Patrick; Ruffell, Simon, et al
TypeJournal article
Date Published9-Dec-2011
Date Created-

Role of F on the Electrical Activation of As in Ge

Author(s)Impellizzeri, G; Napolitani, E; Boninelli, S, et al
TypeJournal article
Date Published2012
Date Created-

Solid Phase Epitaxial Regrowth of Amorphous Layers in Silicon Created by Low Energy Phosphorous Implantation: A Medium Energy Ion Scattering Study

Author(s)Ruffell, Simon; Mitchell, Ian Vaughan; Simpson, Peter J
TypeJournal article
Date Published2006
Date Created-

Structural characterization of B-doped diamond nanoindentation tips

Author(s)Sprouster, David J.; Ruffell, Simon; Bradby, Jodie E., et al
TypeJournal article
Date Published2011
Date Created-

Structural characterization of pressure-induced amorphous silicon

Author(s)Haberl, Bianca; Liu, A. C. Y.; Bradby, Jodie, et al
TypeJournal article
Date Published2009
Date Created-

Structural Relaxation of Ion-implanted Amorphous Silicon

Author(s)Bayu Aji, Leonardus Bimo; Ruffell, Simon; Haberl, Bianca, et al
TypeConference paper
Date Published2012
Date CreatedDecember 9-13 2012

The effect of the annealing ramp rate on the formation of voids in silicon

Author(s)Ruffell, Simon; Simpson, Peter J; Knights, Andrew P
TypeJournal article
Date Published2007
Date Created-

The Mechanical and Photochemical Properties of Titania Coated Silica Nanowires

Author(s)Shalav, Avi; Bullock, James; Anderson, Peter, et al
TypeJournal article
Date Published2012
Date Created-

Thermal evolution of defects produced by implantation of H, D and He in Silicon

Author(s)Simpson, Peter J; Knights, Andrew P; Chicoine, M, et al
TypeJournal article
Date Published2008
Date Created-

Towards controlled growth of carbon nanotubes from germanium on nanoindented silicon substrates

Author(s)Capasso, A; Waclawik, E; Bell, John Marcus, et al
TypeConference paper
Date Published2010
Date CreatedFebruary 22-26 2010

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