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Browsing by Author Ruffell, Simon

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Showing results 10 to 29 of 36

Formation of ordered arrays of gold particles by nanoindentation templating

Author(s)Wong, Sherman; Shalav, Avi; Ruffell, Simon, et al
TypeJournal article
Date Published2014
Date Created-

Formation of ordered arrays of gold particles on silicon and silicon-dioxide by nanoindentation patterning

Author(s)Ruffell, Simon; Venkatachalam, Dinesh; Shalav, Avi, et al
TypeConference paper
Date Published2010
Date CreatedNovember 30-December 4 2009

Formation of Si-nanocrystals in SiO2 via ion implantation and rapid thermal processing

Author(s)Crowe, I. F.; Hulko, Oksana; Knights, Andrew P, et al
TypeConference paper
Date Published2010
Date CreatedJanuary 2010

In-situ electrical probing of zones of nanoindentation-induced phases of silicon

Author(s)Ruffell, Simon; Bradby, Jodie; Williams, Jim, et al
TypeJournal article
Date Published2008
Date Created-

Influence of oxygen on the sputtering of aluminum oxide for the surface passivation of crystallinen silicon

Author(s)Li, Tsu-Tsung (Andrew); Ruffell, Simon; Tucci, Mario, et al
TypeJournal article
Date Published2011
Date Created-

Nanoindentation of ion-implanted crystalline germanium

Author(s)Oliver, David; Ruffell, Simon; Bradby, Jodie, et al
TypeJournal article
Date Published2009
Date Created-

Nanoindentation-induced phase transformation in crystalline silicon and relaxed amorphous silicon

Author(s)Rao, Rui; Bradby, Jodie; Ruffell, Simon, et al
TypeJournal article
Date Published2007
Date Created-

Nanoindentation-induced phase transformations in silicon at elevated temperatures

Author(s)Ruffell, Simon; Bradby, Jodie; Williams, James, et al
TypeJournal article
Date Published2009
Date Created-

Nanoscale Characterization of Energy Generation from Piezoelectric Thin Films

Author(s)Bhaskaran, Madhu; Sriram, Sharath; Ruffell, Simon, et al
TypeJournal article
Date Published2011
Date Created-

Nanoscale energy generation characteristics of piezoelectric thin films

Author(s)Bhaskaran, Madhu; Sriram, Sharath; Ruffell, Simon, et al
TypeConference paper
Date Published2010
Date CreatedDecember 12-15 2010

Novel processing for Si-nanocrystal based photonic materials

Author(s)Halsall, M. P.; Crowe, I. F.; Hylton, N. P., et al
TypeConference paper
Date Published2010
Date CreatedApril 25-30 2010

Optical imaging of graphene using phase shift interferometry

Author(s)Venkatachalam, Dinesh; Parkinson, Patrick; Ruffell, Simon, et al
TypeConference paper
Date Published2012
Date CreatedDecember 9-13 2012

Ordering of Ge islands on Si(001) substrates patterned by nanoindentation

Author(s)Persichetti, Luca; Ruffell, Simon; Capasso, A, et al
TypeJournal article
Date Published2011
Date Created-

PALS-based characterisation of defect structures in F-implanted Germanium

Author(s)Sprouster, David; Campbell, Colin; Buckman, Stephen, et al
TypeConference paper
Date Published2012
Date CreatedDecember 9-13 2012

Phase stability of silicon during indentation at elevated temperature: evidence for a direct transformation from metallic Si-II to diamond cubic Si-I

Author(s)Bhuyan, Satyam; Bradby, Jodie; Ruffell, Simon, et al
TypeJournal article
Date Published2012
Date Created-

Phase transformation pathways in amorphous germanium under indentation pressure

Author(s)Deshmukh, Sarita; Haberl, Bianca; Ruffell, Simon, et al
TypeJournal article
Date Published2014
Date Created-

Quantitative electromechanical characterization of materials using conductive ceramic tips

Author(s)Sprouster, David; Ruffell, Simon; Bradby, Jodie, et al
TypeJournal article
Date Published2014
Date Created-
01_Venkatachalam_Rapid,_substrate-independent_2011.pdf.jpg

Rapid, substrate-independent thickness determination of large area graphene layers

Author(s)Venkatachalam, Dinesh K.; Parkinson, Patrick; Ruffell, Simon, et al
TypeJournal article
Date Published9-Dec-2011
Date Created-

Role of F on the Electrical Activation of As in Ge

Author(s)Impellizzeri, G; Napolitani, E; Boninelli, S, et al
TypeJournal article
Date Published2012
Date Created-

Solid Phase Epitaxial Regrowth of Amorphous Layers in Silicon Created by Low Energy Phosphorous Implantation: A Medium Energy Ion Scattering Study

Author(s)Ruffell, Simon; Mitchell, Ian Vaughan; Simpson, Peter J
TypeJournal article
Date Published2006
Date Created-

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