Skip navigation
Skip navigation

Browsing by Author Ren, Yongling

Or enter first few letters:  
Showing results 11 to 12 of 12
01_Ren_Modeling_the_charge_decay_2011.pdf.jpg

Modeling the charge decay mechanism in nitrogen-rich silicon nitride films

Author(s)Ren, Yongling; Weber, Klaus J.; Nursam, Natalita M.
TypeJournal article
Date Published25-Mar-2011
Date Created-

PECVD Silicon Nitride Passivation on Boron Emitter: The Analysis of Electrostatic Charge on the Interface Properties

Author(s)Nursam, Natalita; Ren, Yongling; Weber, Klaus
TypeJournal article
Date Published2010
Date Created-

Updated:  12 April 2016/ Responsible Officer:  University Librarian/ Page Contact:  Library Systems & Web Coordinator