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Browsing by Author Ren, Yongling

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Low SI surface recombination through negatively charged Si3N4 films

Author(s)Jin, Hao; Weber, Klaus; Zhang, Chun, et al
TypeConference paper
Date Published2009
Date CreatedSeptember 21-24 2009
01_Ren_Modeling_the_charge_decay_2011.pdf.jpg

Modeling the charge decay mechanism in nitrogen-rich silicon nitride films

Author(s)Ren, Yongling; Weber, Klaus J.; Nursam, Natalita M.
TypeJournal article
Date Published25-Mar-2011
Date Created-

PECVD Silicon Nitride Passivation on Boron Emitter: The Analysis of Electrostatic Charge on the Interface Properties

Author(s)Nursam, Natalita; Ren, Yongling; Weber, Klaus
TypeJournal article
Date Published2010
Date Created-

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