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Browsing by Author Ren, Yongling

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Showing results 7 to 12 of 12
01_Liang_Impact_of_laterally_2012.pdf.jpg

Impact of laterally non-uniform carrier lifetime on photoconductance-based lifetime measurements with self-consistent calibration

Author(s)Liang, Wensheng; Weber, Klaus; Ren, Yongling
TypeJournal article
Date Published2012
Date Created-

Investigation of field-effect passivation and interface state parameters at the Al 2 O 3 /Si interface

Author(s)Liang, Wensheng; Weber, Klaus; Suh, Dong Chul, et al
TypeConference paper
Date Published2012
Date CreatedSeptember 24-28 2012

Investigation of interface properties in oxide passivated boron diffused silicon

Author(s)Nursam, Natalita; Weber, Klaus; Jin, Hao, et al
TypeJournal article
Date Published2010
Date Created-

Low SI surface recombination through negatively charged Si3N4 films

Author(s)Jin, Hao; Weber, Klaus; Zhang, Chun, et al
TypeConference paper
Date Published2009
Date CreatedSeptember 21-24 2009
01_Ren_Modeling_the_charge_decay_2011.pdf.jpg

Modeling the charge decay mechanism in nitrogen-rich silicon nitride films

Author(s)Ren, Yongling; Weber, Klaus J.; Nursam, Natalita M.
TypeJournal article
Date Published25-Mar-2011
Date Created-

PECVD Silicon Nitride Passivation on Boron Emitter: The Analysis of Electrostatic Charge on the Interface Properties

Author(s)Nursam, Natalita; Ren, Yongling; Weber, Klaus
TypeJournal article
Date Published2010
Date Created-

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