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Browsing by Author Ren, Fangfang

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01_Huang_Electrical_instability_of_2012.pdf.jpg

Electrical instability of amorphous indium-gallium-zinc oxide thin film transistors under monochromatic light illumination

Author(s)Huang, Xiaoming; Wu, Chenfei; Lu, Hai, et al
TypeJournal article
Date Published14-Jun-2012
Date Created-
01_Huang_Enhanced_bias_stress_stability_2013.pdf.jpg

Enhanced bias stress stability of a-InGaZnO thin film transistors by inserting an ultra-thin interfacial InGaZnO:N layer

Author(s)Huang, Xiaoming; Wu, Chenfei; Lu, Hai, et al
TypeJournal article
Date Published13-May-2013
Date Created-
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