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Browsing by Author Petravic, M.

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Characterization of molecular nitrogen in III-V compound semiconductors by near-edge x-ray absorption fine structure and photoemission spectroscopies

Author(s)Bozanic, A.; Majlinger, Z.; Petravic, M., et al
TypeJournal article
Date Published9-Jun-2008
Date Created-

Electrical characterization of p-GaAs epilayers disordered by doped spin-on-glass

Author(s)Deenapanray, P. N. K.; Petravic, M.; Jagadish, C., et al
TypeJournal article
Date Published19-Jan-2005
Date Created-

Selectivity of nanocavities and dislocations for gettering of Cu and Fe in silicon

Author(s)Stritzker, B.; Petravic, M.; Wong-Leung, Jennifer, et al
TypeJournal article
Date Published30-Apr-2001
Date Created-
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