Browsing by Author McCallum, Jeffrey C.
Showing results 3 to 22 of 26
Comparison between implanted boron and phosphorus in silicon wafers
Author(s) | Burgess, Jack; Johnson, Brett; Villis, Byron, et al |
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Type | Conference paper |
Date Published | 2010 |
Date Created | December 12-15 2010 |
Defect Formation Due to the Crystallization of Deep Amorphous Volumes Formed in Silicon by Mega Electron Volt (MeV) Ion Implantation
Author(s) | Liu, A. C. Y.; McCallum, Jeffrey C.; Wong-Leung, Jennifer |
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Type | Journal article |
Date Published | 2001 |
Date Created | - |
Defective Crystal Recovered from the Crystallization of Potassium-doped Amorphous Silicon Films
Author(s) | Liu, A. C. Y.; McCallum, Jeffrey C.; Deenapanray, Prakash |
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Type | Journal article |
Date Published | 2003 |
Date Created | - |
Dopant effects on the photoluminescence of interstitial-related centers in ion implanted silicon
Author(s) | Johnson, B. C.; Villis, B. J.; Burgess, J. E., et al |
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Type | Journal article |
Date Published | 10-May-2012 |
Date Created | - |
Effect of boron on formation of interstitial-related luminescence centres in ion implanted silicon
Author(s) | McCallum, Jeffrey C.; Villis, Byron; Johnson, Brett, et al |
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Type | Journal article |
Date Published | 2011 |
Date Created | - |
Effect of boron on interstitial-related luminescence centers in silicon
Author(s) | Charnvanichborikarn, Supakit; Villis, Byron; Johnson, Brett, et al |
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Type | Journal article |
Date Published | 2010 |
Date Created | - |
Evidence for the R8 phase of germanium
Author(s) | Johnson, Brett; Haberl, Bianca; Deshmukh, Sarita, et al |
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Type | Journal article |
Date Published | 2013 |
Date Created | - |
Formation of an r8-Dominant Si Material
Author(s) | Wong, Sherman; Haberl, Bianca; Johnson, Brett, et al |
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Type | Journal article |
Date Published | 2019 |
Date Created | - |
Hydrogen blister depth and surfcce roughness during the ion-cut process
Author(s) | Pyke, Daniel; Elliman, Robert; McCallum, Jeffrey C. |
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Type | Conference paper |
Date Published | 2010 |
Date Created | November 25-27 2009 |
Hydrogen in amorphous Si and Ge during solid phase epitaxy
Author(s) | Johnson, Brett; Caradonna, P.; Pyke, D. J., et al |
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Type | Journal article |
Date Published | 2010 |
Date Created | - |
Hydrogen Platelet Evolution in Mechanically Strained Silicon
Author(s) | Pyke, Daniel; Elliman, Robert; McCallum, Jeffrey C. |
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Type | Conference paper |
Date Published | 2010 |
Date Created | December 12-15 2010 |
Hydrogen refinement during solid phase epitaxy of buried amorphous silicon layers
Author(s) | Pyke, D. J.; McCallum, Jeffrey C.; Johnson, B. C. |
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Type | Journal article |
Date Published | 2010 |
Date Created | - |
Implantation Angle Dependent Study of Vacancy Related Defect Profiles in Ion Implanted Silicon
Author(s) | Lay, M. D. H.; McCallum, Jeffrey C.; Jagadish, Chennupati |
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Type | Journal article |
Date Published | 2003 |
Date Created | - |
Nanomechanical Sensing Using Spins in Diamond
Author(s) | Barson, Michael; Peddibhotla, Phani; Ovartchaiyapong, Preeti, et al |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
Optical addressing of an individual erbium ion in silicon
Author(s) | Yin, Chunming; Rancic, Milos; de Boo, Gabriele G., et al |
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Type | Journal article |
Date Published | 2013 |
Date Created | - |
Photo-ionisation spectra of single erbium centres by charge sensing with a nano transistor
Author(s) | Yin, Chunming; Rancic, Milos; Stavrias, Nikolas, et al |
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Type | Conference paper |
Date Published | 2012 |
Date Created | December 12-14 2012 |
Progress towards Opto-Electronic Characterization of Indium Phosphide Nanowire Transistors at milli-Kelvin temperatures
Author(s) | Willems van Beveren, L. H.; McCallum, Jeffrey C.; Jagadish, Chennupati, et al |
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Type | Conference paper |
Date Published | 2012 |
Date Created | December 12-14 2012 |
Raman study on the phase transformations of the meta-stable phases of Si induced by indentation
Author(s) | Johnson, Brett; Stavrias, Nikolas; Haberl, Bianca, et al |
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Type | Conference paper |
Date Published | 2012 |
Date Created | December 12-14 2012 |
Single Rare-Earth Ions as Atomic-Scale Probes in Ultrascaled Transistors
Author(s) | Zhang, Qi; Hu, Guangchong; de Boo, Gabriele G., et al |
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Type | Journal article |
Date Published | 2019 |
Date Created | - |
Spatial mapping of band bending in semiconductor devices using in situ quantum sensors
Author(s) | Broadway, David A.; Dontschuk, Nikolai; Tsai, A., et al |
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Type | Journal article |
Date Published | 13-Sep-2018 |
Date Created | - |
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