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Browsing by Author Grant, Nicholas

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Influence of Annealing and Bulk Hydrogenation on Lifetime Limiting Defects in Nitrogen-Doped Floating Zone Silicon

Author(s)Rougieux, Fiacre; Grant, Nicholas; Barugkin (Qiaoke), Chog, et al
TypeJournal article
Date Published2015
Date Created-

Low surface recombination velocities achieved by silicon dioxide grown electrochemically in nitric acid

Author(s)Grant, Nicholas; McIntosh, Keith
TypeConference paper
Date Published2011
Date CreatedJune 19-24 2011

Low Surface Recombination Velocity on (100) Silicon by Electrochemically Grown Silicon Dioxide Annealed at Low Temperature

Author(s)Grant, Nicholas; McIntosh, Keith
TypeJournal article
Date Published2010
Date Created-

Manipulation of stored charge density and polarity in anodic aluminium oxide for silicon solar cell passivation

Author(s)Lu, Zhong; Ouyang, Z; Grant, Nicholas, et al
TypeJournal article
Date Published2015
Date Created-

Manipulation of stored charge in anodic aluminium oxide/SiO2 dielectric stacks by the use of pulsed anodisation

Author(s)Grant, Nicholas; Lu, Zhong; Wan, Yimao, et al
TypeJournal article
Date Published2016
Date Created-

Passivation of a (100) Silicon Surface by Silicon Dioxide Grown in Nitric Acid

Author(s)Grant, Nicholas; McIntosh, Keith
TypeJournal article
Date Published2009
Date Created-

Quantifying the optical losses in back-contact solar cells

Author(s)McIntosh, Keith; Kho, Teng; Fong, Kean, et al
TypeConference paper
Date Published2014
Date CreatedJune 8-13 2014

Silicon surface passivation by anodic oxidation annealed at 400C

Author(s)Grant, Nicholas; McIntosh, Keith
TypeJournal article
Date Published2014
Date Created-

Surface passivation attained by silicon dioxide grown at low temperature in nitric acid

Author(s)Grant, Nicholas; McIntosh, Keith
TypeConference paper
Date Published2009
Date CreatedSeptember 21-24 2009

Thermal activation and deactivation of grown-in defects limiting the lifetime of float-zone silicon

Author(s)Grant, Nicholas; Markevich, Vladimir P; Mullins, Jack, et al
TypeJournal article
Date Published2016
Date Created-

Thermal deactivation of lifetime- limiting grown-in point defects in n-type Czochralski silicon wafers

Author(s)Rougieux, Fiacre; Grant, Nicholas; MacDonald, Daniel
TypeJournal article
Date Published2013
Date Created-

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