Browsing by Author Glover, Christopher
Showing results 22 to 33 of 33
Resonant inelastic soft X-ray scattering at hollow lithium states in solid LiCl
Author(s) | Agaker, Marcus; Soderstrom, Johan; Kaambre, Tanel, et al |
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Type | Journal article |
Date Published | 2004 |
Date Created | - |
Stationary and dispersive features in resonant inelastic soft X-ray scattering at the Ge 3p resonances
Author(s) | Glover, Christopher; Schmitt, T; Mattesini, Maurizio, et al |
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Type | Journal article |
Date Published | 2009 |
Date Created | - |
Structural characterisation of amorphised compound semiconductors
Author(s) | Ridgway, Mark C; Glover, Christopher; Yu, Kin Man, et al |
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Type | Journal article |
Date Published | 2001 |
Date Created | - |
Structural Characterization of Amorphized InP: Evidence for Chemical Disorder
Author(s) | Glover, Christopher; Ridgway, Mark C; Yu, Kin Man, et al |
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Type | Journal article |
Date Published | 1999 |
Date Created | - |
Structural Characterization of Cu Nanocrystals Formed in SiO 2 by High-Energy Ion-Beam Synthesis
Author(s) | Johannessen, Bernt; Kluth, Patrick; Glover, Christopher, et al |
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Type | Journal article |
Date Published | 2005 |
Date Created | - |
Structural Modifications in Amorphous Ge Produced by Ion Implantation
Author(s) | Desnica-Frankovic, I D; Furic, K; Desnica, U V, et al |
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Type | Journal article |
Date Published | 2001 |
Date Created | - |
Structural Perturbations Within Ge Nanocrystals in Silica
Author(s) | Cheung, Allen; de Azevedo, Gustavo; Glover, Christopher, et al |
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Type | Journal article |
Date Published | 2004 |
Date Created | - |
Structural stability of Cu nanocrystals in SiO 2 exposed to high-energy ion irradiation
Author(s) | Johannessen, Bernt; Kluth, Patrick; Glover, Christopher, et al |
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Type | Journal article |
Date Published | 2006 |
Date Created | - |
Structural-relaxation-induced Bond Length and Bond Angle Changes in Amorphized Ge
Author(s) | Glover, Christopher; Ridgway, Mark C; Yu, Kin Man, et al |
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Type | Journal article |
Date Published | 2001 |
Date Created | - |
Structure and Low-temperature Thermal Relaxation of Ion-implanted Germanium
Author(s) | Glover, Christopher; Ridgway, Mark C; Yu, Kin Man, et al |
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Type | Journal article |
Date Published | 2001 |
Date Created | - |
Structure in Amorphous Semiconductors: Extrinsic and Intrinsic
Author(s) | Ridgway, Mark C; Glover, Christopher; Azevedo, G de M, et al |
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Type | Journal article |
Date Published | 2005 |
Date Created | - |
Structure of Amorphous Silicon Investigated by EXAFS
Author(s) | Glover, Christopher; Foran, Garry J; Ridgway, Mark C |
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Type | Journal article |
Date Published | 2003 |
Date Created | - |
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