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Electrical properties of different types of grain boundaries in multicrystalline silicon by photoluminescence imaging
Author(s) | Sio, Hang Cheong (Kelvin); Trupke, T.; Phang, Sieu Pheng, et al |
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Type | Conference paper |
Date Published | 2012 |
Date Created | September 24-28 2012 |
Fluorine Passivation of Defects and Interfaces in Crystalline Silicon
Author(s) | Sio, Hang Cheong; Kang, Di; Liu, Rong, et al |
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Type | Journal article |
Date Published | 2021 |
Date Created | - |
Growth of Oxygen Precipitates and Dislocations in Czochralski Silicon
Author(s) | Rougieux, Fiacre; Nguyen, Hieu; MacDonald, Daniel, et al |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
Hydrogenation Mechanisms of Poly-Si/SiOx Passivating Contacts by Different Capping Layers
Author(s) | Truong, Thien; Yan, Di; Chen, Wenhao, et al |
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Type | Journal article |
Date Published | 2019 |
Date Created | - |
Impact of minority-impurity scattering on the carrier mobility in compensated silicon
Author(s) | Rougieux, Fiacre; Forster, Maxime; MacDonald, Daniel, et al |
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Type | Conference paper |
Date Published | 2012 |
Date Created | November 5-9 2012 |
Laser chemical processing (LCP) doping formed through differenct dielectric layers
Author(s) | Yang, Xinbo; Fell, Andreas; Xu, Lujia, et al |
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Type | Conference paper |
Date Published | 2013 |
Date Created | September 30-October 4 2013 |
Lifetime Spectroscopy and Hydrogenation of Chromium in n- and p-type Cz Silicon
Author(s) | Sun, Chang; Liu, An Yao; Rougieux, Fiacre, et al |
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Type | Journal article |
Date Published | 2015 |
Date Created | - |
Microscopic Distributions of Defect Luminescence from Subgrain Boundaries in Multicrystalline Silicon Wafers
Author(s) | Nguyen, Hieu; Jensen, Mallory Ann; Li, Li, et al |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
Optical Evaluation of Silicon Wafers With Rounded Rear Pyramids
Author(s) | McIntosh, Keith; Zin, Ngwe Soe; Nguyen, Hieu, et al |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
Photoluminescence imaging for net doping measurements of surface limited silicon wafers
Author(s) | Lim, Siew Yee; Forster, Maxime; Zhang, Xinyu, et al |
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Type | Conference paper |
Date Published | 2012 |
Date Created | November 5-9 2012 |
Photoluminescence Spectra of Moderately Doped, Compensated Silicon Si:P,B at 79-300 K
Author(s) | Liu, Anyao; Nguyen, Hieu; MacDonald, Daniel |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
Studying precipitation and dissolution of iron in multicrystalline silicon wafers during annealing
Author(s) | Liu, An Yao; Walters, Daniel; MacDonald, Daniel |
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Type | Conference paper |
Date Published | 2012 |
Date Created | November 5-9 2012 |
Uncertainty in Photoluminescence Metrology on Multicrystalline Silicon Bricks and Cross Validation With Wafers
Author(s) | Chung, Daniel; Mitchell, Bernhard; Goodarzi, Mohsen, et al |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
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