Browsing by Author 4912b1ca-8068-4d0b-8794-6a206918b660
Showing results 1 to 17 of 17
Depth profiling of ion-implanted samples by high-energy electron scattering
Author(s) | Trombini, Henrique; Vos, Maarten; Elliman, Rob, et al |
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Type | Journal article |
Date Published | 2020 |
Date Created | - |
Development of a new database for Auger electron and X-ray spectra
Author(s) | Tee, Pi; Kibedi, Tibor; Lee, Boon, et al |
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Type | Conference paper |
Date Published | 2020 |
Date Created | September 9-13 2019 |
Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications
Author(s) | Winkelmann, A; Nolze, G; Vespucci, S, et al |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
The effect of ion implantation on reflection electron energy loss spectroscopy: The case of Au implanted Al films
Author(s) | Trombini, Henrique; Vos, Maarten; Marmitt, G.G., et al |
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Type | Journal article |
Date Published | 2020 |
Date Created | - |
Element-resolved Kikuchi pattern measurements of non-centrosymmetric materials
Author(s) | Vos, Maarten; Winkelmann, A |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
Elucidating the capability of electron backscattering for 3D nano-structure determination
Author(s) | Trombini, Henrique; Vos, Maarten; Reboh, S, et al |
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Type | Journal article |
Date Published | 2020 |
Date Created | - |
Extension schemes of the dielectric function, and their implications for ion stopping calculations
Author(s) | Vos, Maarten; Grande, P L |
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Type | Journal article |
Date Published | 2019 |
Date Created | - |
High-resolution conversion electron spectroscopy of the i 125 electron-capture decay
Author(s) | Tee, Bryan Pi Ern; Stuchbery, Andrew; Vos, Maarten, et al |
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Type | Journal article |
Date Published | 2019 |
Date Created | - |
How the choice of model dielectric function affects the calculated observables
Author(s) | Vos, Maarten; Grande, P L |
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Type | Journal article |
Date Published | 2017 |
Date Created | - |
The influence of radiation damage on electrons and ion scattering measurements from PVC films
Author(s) | Tee, Bryan Pi Ern; Vos, Maarten; Selau, F F, et al |
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Type | Journal article |
Date Published | 2021 |
Date Created | - |
Modelling the contribution of semi-core electrons to the dielectric function
Author(s) | Vos, Maarten; Grande, P L |
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Type | Journal article |
Date Published | 2019 |
Date Created | - |
Nonlinear stopping effects of slow ions in a no-free-electron system: Titanium nitride
Author(s) | Matias, F.; Grande, P L; Vos, Maarten, et al |
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Type | Journal article |
Date Published | 2019 |
Date Created | - |
On the energy-loss straggling of protons in elemental solids: The importance of electron bunching
Author(s) | Selau, F F; Trombini, Henrique; Fadanelli, Raul C, et al |
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Type | Journal article |
Date Published | 2021 |
Date Created | - |
Profiling As plasma doped Si/SiO2 with molecular ions
Author(s) | Trombini, Henrique; Alencar, Igor; Marmitt, G.G., et al |
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Type | Journal article |
Date Published | 2019 |
Date Created | - |
Quantitative electron spectroscopy of 125 I over an extended energy range
Author(s) | Alotiby, Mohmmed; Greguric, Ivan; Kibedi, Tibor, et al |
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Type | Journal article |
Date Published | 15-Feb-2019 |
Date Created | - |
Room temperature synthesis of HfO₂/HfOx heterostructures by ion-implantation
Author(s) | Nandi, Sanjoy; Venkatachalam, Dinesh; Ruffell, S., et al |
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Type | Journal article |
Date Published | 2018 |
Date Created | - |
Stopping and straggling of 60-250-keV backscattered protons on nanometric Pt films
Author(s) | Selau, F F; Trombini, Henrique; Marmitt, G.G., et al |
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Type | Journal article |
Date Published | 2020 |
Date Created | - |
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