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Showing results 5 to 10 of 10
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Kinetics and dynamics of the regeneration of boron-oxygen defects in compensated n-type silicon

Author(s)Sun, Chang; Chen, Daniel; Rougieux, Fiacre E, et al
TypeJournal article
Date Published2019
Date Created-

An Open Source Based Repository for Defects in Silicon

Author(s)Juhl, Mattias; Heinz, Friedemann D; Coletti, Gianluca, et al
TypeConference paper
Date Published2018
Date CreatedJune 10-15 2018

Photoconductance Determination of Carrier Capture Cross Sections of Slow Traps in Silicon through Variable Pulse Filling

Author(s)Siriwardhana, Manjula; Zhu, Yan; Hameiri, Ziv, et al
TypeJournal article
Date Published2021
Date Created-

Ring-Like Defect Formation in N-Type Czochralski-Grown Silicon Wafers during Thermal Donor Formation

Author(s)Basnet, Rabin; Sio, Hang Cheong; SIRIWARDHANA, MANJULA, et al
TypeJournal article
Date Published2020
Date Created-

Slow minority carrier trapping and de-trapping in Czochralski silicon: Influence of thermal donors and the doping density

Author(s)Siriwardhana, Manjula; Macdonald, Daniel; Heinz, Friedemann D, et al
TypeConference paper
Date Published2018
Date CreatedJune 10-15 2018

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