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Novel analysis technique for measuring edge density fluctuation profiles with reflectometry in the Large Helical Device
Author(s) | Creely, A. J.; Ida, K.; Yoshinuma, M., et al |
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Type | Journal article |
Date Published | 19-Jul-2017 |
Date Created | - |
Tritium retention in W plasma-facing materials: Impact of the material structure and helium irradiation
Author(s) | Bernard, Elodie; Sakamoto, R; Hodille, Etienne, et al |
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Type | Journal article |
Date Published | May-2019 |
Date Created | - |
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