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Bulk Lifetimes up to 20 ms Measured on Unpassivated Silicon Discs Using Photoluminescence Imaging

Author(s)Chung, Daniel; Mitchell, Bernhard; Goodarzi, Mohsen, et al
TypeJournal article
Date Published2017
Date Created-
01_Sio_Comparison_of_Recombination_2015.pdf.jpg

Comparison of Recombination Activity of Grain Boundaries in Various Multicrystalline Silicon Materials

Author(s)Sio, Hang Cheong (Kelvin); Phang, Sieu Pheng; Nguyen, Hieu, et al
TypeConference paper
Date Published2015
Date CreatedSeptember 14-18 2015

Quantification of Sheet Resistance in Boron-Diffused Silicon Using Micro-Photoluminescence Spectroscopy at Room Temperature

Author(s)Nguyen, Hieu; Johnston, Steve; Paduthol, Appu, et al
TypeJournal article
Date Published2017
Date Created-

Uncertainty in Photoluminescence Metrology on Multicrystalline Silicon Bricks and Cross Validation With Wafers

Author(s)Chung, Daniel; Mitchell, Bernhard; Goodarzi, Mohsen, et al
TypeJournal article
Date Published2017
Date Created-
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